Clock period sensing circuit

ABSTRACT

Disclosed is a clock period sensing circuit in which it is possible to broaden the operating range of phase adjustment and frequency multiplier circuits, etc., by performing coarse period adjustment in advance. A plurality of delay sensing circuits having slightly overlapping operating ranges and different centers of operation are connected in parallel with respect to a an input clock signal, which is passed through the delay sensing circuits. The period of the clock is sensed coarsely in short periods using a signal which identifies delay sensing circuits through which the clock signal has passed and delay sensing circuits through which the clock signal has not passed.

FIELD OF THE INVENTION

[0001] This invention relates to a clock period sensing circuit and,more particularly, to a clock delay sensing circuit capable of sensingdelay and finely adjusting the same.

BACKGROUND OF THE INVENTION

[0002] Examples of conventional clock delay sensing circuits include aseries of sensing circuits comprising a series of inverters, and meansfor sensing delay from the number of stages of a ring oscillator. Forexample, as shown in FIG. 10, there is known an arrangement in which aperiod sensing circuit 206 comprises a ring oscillator of a fixed numberof stages and a counter, in which the oscillation frequency of the ringoscillator in the period of an input clock is counted by the counter tosense the clock period.

[0003] Further, FIG. 11 illustrates an example of the construction of asynchronous delay circuit according to the prior art. This circuit hasas its basic components a first delay circuit line 901 for measuringdelay (“measuring delay line”) and a second delay circuit line 902 forreconstructing delay (“synchronizing delay line”), the direction ofsignal propagation of the latter being the opposite of the former. Theoutput end of the second delay circuit line 902 is connected to anoutput buffer (having a delay time td2), and a transfer control circuit903 is provided between the first delay circuit line 901 and seconddelay circuit line 902. The transfer control circuit 903 turns on uponreceiving an output from an input buffer 904. A dummy delay circuit 906having a delay time td1+td2 is inserted between an output end of theinput buffer 904 and an input end of the first delay circuit line 901.

[0004] An input clock signal enters the first delay circuit line 901from the input buffer 904 and propagates through the first delay circuitline 901 by the time the next pulse enters following the clock signalperiod (tCK). At the moment the next pulse enters, the transfer controlcircuit 903 turns on so that a pulse that has propagated through thefirst delay circuit line 901 over a period of time equal to(tCK−td1−td2) enters the second delay circuit line 902 from thisposition, propagates through and is output from the second delay circuitline 902 over the time period (tCK−td1−td2) of propagation through thefirst delay circuit line 901. The pulse is output via an output buffer905 (whose delay time is td2). Thus, a signal delayed by 2tCK from theinput In is output at an output terminal Out, where [input buffer(td1)]+[delay circuit (td1+td2)]+{first and second delay circuits [2×(tCK−td1−td2) ]}+[output buffer (td2)]=2tCK.

SUMMARY OF THE DISCLOSURE

[0005] In this arrangement of the conventional delay sensing circuitcomprising a series of inverters in which the inverter is a unit delaycircuit, the unit of delay is decided by the propagation delay time ofone inverter stage. Consequently, if the clock period in a subsequentstage is to be finely adjusted, it is required that the unit of delayused in coarse adjustment be changed over at the ends of the operatingrange. The reason for this is that there is no overlapping of operatingranges in terms of the individual units of delay.

[0006] Accordingly, it is an object of the present invention to providea clock period sensing circuit in which it is possible to broaden theoperating range of phase adjustment and frequency multiplier circuits,etc. It is another object of the present invention to provide a clockperiod sensing circuit in which it is possible to broaden the operatingrange of phase adjustment and frequency multiplier circuits, etc.,particularly allowing performing coarse period adjustment in advance.

[0007] According to a first aspect of the present invention, theforegoing object is attained by providing a clock period sensing circuitcomprising: a plurality of parallel connected delay sensing circuitshaving slightly overlapping operating ranges and different centers ofoperation, wherein a clock signal is passed through the plurality ofdelay sensing circuits, and the period of the clock is sensed using asignal which identifies delay sensing circuits through which the clocksignal has passed and delay sensing circuits through which the clocksignal has not passed.

[0008] According to a second aspect of the present invention, there isprovided a clock period sensing circuit comprising: a plurality of delaycircuits to which a clock signal is applied as a common input and whichare arranged in parallel and have delay times that differ from oneanother; a plurality of latch circuits to which outputs of respectiveones of the delay circuits are input for latching the clock signal as alatch timing signal; and a plurality of encoder circuits to which theoutputs of the latch circuits are input for encoding informationrepresenting a boundary between delay circuits traversed by the clocksignal and delay circuits not traversed by the clock signal, andoutputting the encoded information as a control signal.

[0009] According to a third aspect of the present invention, the clockperiod sensing circuit is characterized in that the plurality of delaycircuits have operating ranges that overlap each other slightly andcenters of operation that differ from one another.

[0010] According to a fourth aspect of the present invention, the clockperiod sensing circuit is characterized in that each of the delaycircuits has:

[0011] a P-type transistor which is connected between a power supply andan internal node and to which a signal obtained by inverting an inputsignal is applied as a gate input; and

[0012] an N-type transistor, which is driven by a constant-currentsource, connected between the internal node and ground and to which thesignal obtained by inverting the input signal is applied as a gateinput;

[0013] a plurality of serially connected switches and capacitors beingconnected in parallel between the internal node and ground, and delaytime being decided by deciding a capacitance applied to the internalnode by a capacitance control signal connected to a control terminal ofeach switch;

[0014] the delay circuit having an inverter for inverting and outputtinga potential present at the internal node.

[0015] According to a fifth aspect of the present invention, there isprovided a timing dividing circuit (interpolator) comprising:

[0016] first, second and third timing dividing circuit (interpolator)sconnected in parallel and each having a P-type transistor which isconnected between a power supply and an internal node and to which asignal obtained by taking NAND between first and second input signals isapplied as a gate input, and first and second N-type transistors, whichare driven by a constant-current source, connected between the internalnode and ground and to which signals obtained by inverting the first andsecond input signals are applied as gate inputs; a plurality of seriallyconnected switches and capacitors being connected in parallel betweenthe internal node and ground, and delay time being decided by deciding acapacitance applied to the internal node by a capacitance control signalconnected to a control terminal of each switch; each timing dividingcircuit (interpolator) having an inverter for inverting and outputting apotential present at the internal node;

[0017] wherein a first clock of two clocks having different phases issupplied commonly as the first and second input signals to the firsttiming dividing circuit (interpolator);

[0018] first and second clocks constituting the two clocks having thedifferent phases are supplied as the first and second input signals tothe second timing dividing circuit (interpolator); and

[0019] a second clock of the two clocks having the different phases issupplied commonly as the first and second input signals to the thirdtiming dividing circuit (interpolator);

[0020] the capacitance of the timing dividing circuit (interpolator)being selected by the control signal from the clock period sensingcircuit according to any one of the first to fourth aspects.

[0021] According to a sixth aspect of the present invention, the timingdividing circuit (interpolator) is characterized in that the capacitanceis set in such a manner that ranges over which the timing dividingcircuit (interpolator) outputs a timing which is one-half the differencebetween the timings of the first and second clock inputs overlap eachother along a time axis.

[0022] According to a seventh aspect of the present invention, there isprovided a clock frequency multiplier circuit for outputting afrequency-multiplied clock, comprising:

[0023] a frequency dividing circuit for frequency-dividing a clocksignal, generating and outputting a multiphase clock;

[0024] a clock period sensing circuit to which the clock signal isinput;

[0025] a plurality of timing dividing circuits (interpolators) foroutputting timing signals obtaining by dividing differences betweeninput timings of the multiphase clock; and

[0026] multiplexer circuits for multiplexing outputs of the plurality oftiming dividing circuits (interpolators);

[0027] wherein the clock period sensing circuit comprises the clockperiod sensing circuit according to any one of the first to fourthaspects.

[0028] According to an eighth aspect of the present invention, the clockfrequency multiplier circuit is characterized in that each of the timingdividing circuits (interpolators) has:

[0029] a P-type transistor which is connected between a power supply andan internal node and to which a signal obtained by taking NAND betweenfirst and second input signals is applied as a gate input; and

[0030] first and second N-type transistors, which are driven by aconstant-current source, connected between the internal node and groundand to which signals obtained by inverting the first and second inputsignals are applied as gate inputs;

[0031] a plurality of serially connected switches and capacitors beingconnected in parallel between the internal node and ground, and amountof delay being decided by deciding a capacitance applied to the internalnode by a capacitance control signal connected to a control terminal ofeach switch;

[0032] each timing dividing circuit (interpolator) having an inverterfor inverting and outputting a potential present at the internal node;

[0033] the capacitance being decided by a control signal from the clockperiod sensing circuit.

[0034] According to a ninth aspect, in the circuit according to thesecond aspect, each of said delay circuits has:

[0035] a first-type transistor which is connected between a power supplyand an internal node and to which a signal indicative of an input signalis applied as a gate input; and

[0036] a second-type transistor, which is driven by a constant-currentsource, connected between said internal node and ground and to which thesignal indicative of the input signal is applied as a gate input;

[0037] a plurality of serially connected switches and capacitors beingconnected in parallel between said internal node and ground, and delaytime being decided by deciding a capacitance applied to said internalnode by a capacitance control signal connected to a control terminal ofeach switch;

[0038] said delay circuit outputting an output signal indicative of apotential present at said internal node.

[0039] According to a tenth aspect, there is provided a timing dividingcircuit (interpolator) comprising:

[0040] first, second and third timing dividing circuits (interpolators)connected in parallel and each having a first-type transistor which isconnected between a power supply and an internal node and to which asignal obtained by taking logic between first and second input signalsis applied as a gate input, and first and second-type transistors, whichare driven by a constant-current source, connected between said internalnode and ground and to which a signal obtained by inverting said signalobtained from the first and second input signals is applied as gateinputs; a plurality of serially connected switches and capacitors beingconnected in parallel between said internal node and ground, and delaytime being decided by deciding a capacitance applied to said internalnode by a capacitance control signal connected to a control terminal ofeach switch; each timing dividing circuit (interpolator) outputting anoutput signal indicative of a potential present at said internal node;

[0041] wherein a first clock of two clocks having different phases issupplied commonly as the first and second input signals to said firsttiming dividing circuit (interpolator);

[0042] first and second clocks constituting the two clocks having thedifferent phases are supplied as the first and second input signals tosaid second timing dividing circuit (interpolator); and

[0043] a second clock of the two clocks having the different phases issupplied commonly as the first and second input signals to said thirdtiming dividing circuit (interpolator);

[0044] the capacitance of said timing dividing circuit (interpolator)being selected by the control signal from the clock period sensingcircuit according to the first aspect.

[0045] Other features and advantages of the present invention will beapparent from the following description taken in conjunction with theaccompanying drawings, in which like reference characters designate thesame or similar parts throughout the figures thereof.

BRIEF DESCRIPTION OF THE DRAWINGS

[0046]FIG. 1 is a diagram illustrating an arrangement for practicing thepresent invention;

[0047]FIG. 2 is a block diagram showing an arrangement according to anembodiment of the present invention;

[0048]FIG. 3 is a diagram illustrating the construction of a delaycircuit according to an embodiment of the present invention;

[0049]FIG. 4 is a diagram showing the construction of a timing dividingcircuit (interpolator) according to an embodiment;

[0050]FIG. 5 is a diagram illustrating operation timing waveformsaccording to an embodiment;

[0051]FIG. 6 is a diagram illustrating the manner in which timing isgenerated by the timing dividing circuit (interpolator) according to anembodiment;

[0052]FIG. 7 is a diagram illustrating the manner in which timing isgenerated by the timing dividing circuit (interpolator) according to anembodiment;

[0053]FIG. 8 is a diagram illustrating the relationship between thecapacitance of a timing dividing circuit (interpolator) and delay ratioaccording to an embodiment;

[0054]FIG. 9 is a diagram showing an operating region according to anembodiment;

[0055]FIG. 10 is a block diagram illustrating the construction of aclock frequency multiplier circuit according to the prior art; and

[0056]FIG. 11 is a diagram illustrating the construction of asynchronous delay circuit according to the prior art.

DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0057] A mode for practicing the present invention will be describedbelow.

[0058]FIG. 1 is a diagram illustrating an arrangement of a clock periodsensing circuit for practicing the present invention. As shown in FIG.1, a plurality of delay sensing circuits 2 having slightly differentdelay times are arranged in parallel with respect to an input clocksignal 1, and the clock signal 1 is passed through a plurality of thedelay sensing circuits 2. By identifying from outputs of detectionsignals 3 those delay sensing circuits that have and have not beentraversed by the clock signal, the clock period can be sensed coarselyin short periods.

[0059] Further, in a preferred embodiment of the present invention, asshown in FIG. 2, a clock period sensing circuit comprises a plurality ofdelay circuits 103.to which a clock signal is input and which arearranged in parallel with delay times that differ from one another, aplurality of latch circuits 103 to which the outputs of respective onesof the delay circuits 103 are input for latching the clock signal as alatch timing signal, and encoder circuits 104 to which the outputs ofthe latch circuits 103 are input for detecting a boundary between delaycircuits traversed by the clock signal and delay circuits not traversedby the clock signal, encoding the boundary as a control signal andoutputting a control signal 105.

DETAILED DESCRIPTION OF THE EMBODIMENTS

[0060] An embodiment of the present invention will now be described ingreater detail with reference to the drawings.

[0061] By way of example, in a circuit for adjusting the phase of aclock signal or for frequency multiplying the same using a timingdividing circuit (interpolator) which generates a timing obtained byinternally dividing the difference between the input timings of twoinputs [for example, see Japanese Patent Kokai Publication JP-A-11-4146(Application No. 09-157042) and JP-A-11-4145 (Application No.09-157028), the clock period that can be used is decided by capacitance,etc., connected to the output section of the timing dividing circuit(interpolator) (referred to as a “timing-difference dividing unit”).

[0062] Conversely, the frequency range capable of being used by thecircuit can be broadened by sensing the clock period and deciding thesize of the capacitance, etc.

[0063] In order to sense a clock period in this embodiment of thepresent invention, there are provided a plurality of parallel-connectedcircuits in which the circuit constants have been decided in such amanner that the operating frequency range of each circuit is overlappedslightly by the operating frequency range of the next circuit, the clockperiod is sensed as a value such as the capacitance of a correctly(normally) operating circuit, and a fine adjustment is performed by aseparate circuit disposed as a subsequent stage.

[0064]FIG. 2 is a block diagram illustrating the construction of thisembodiment of the present invention. As shown in FIG. 2, the embodimentincludes the latch circuits 103 and encoders 104 provided as the finalstages of respective ones of the plurality of parallel delay circuits102 having delay times that differ from one another.

[0065] Each latch circuit 103 has a data input terminal (D) to which theoutput of the corresponding of the delay circuit 102 is input and aclock input terminal (C) to which a signal obtained by inverting a clocksignal 101 by an inverter is input. The latch circuit latches andoutputs this signal.

[0066] The delay times of the plurality of delay circuits 102 are setto, e. g., X1, X1.5, X2, X4, X6, X8, X12 and X16. The clock signal 101that has traversed a delay circuit 102 is latched in the correspondinglatch circuit 103 at the rising edge of the signal obtained by invertingthe clock signal 101. Information indicating the boundary between agroup of latch circuits corresponding to delay circuits traversed by theclock signal and a group of latch circuits corresponding to delaycircuits not traversed by the clock signal is output from the encodercircuit 104 as a control signal 105. With the exception of the encodercircuit 104 at the lower end, each encoder circuit 104 receives theoutputs of two mutually adjacent latch circuits 103 as inputs andencodes the same.

[0067]FIG. 3 is a diagram illustrating the construction of the delaycircuit 102 according to this embodiment. As shown in FIG. 3, the delaycircuit 102 has an external input IN1 connected to input terminals of aNAND gate NAND01 and inverters INV01, INV02. An output of the NAND gateNAND01 is connected to a gate electrode of a P-type MOS transistor MP01,an output of the inverter INV01 is connected to a gate electrode of anN-type MOS transistor MN02, and an output of the inverter INV02 isconnected to a gate electrode of an N-type MOS transistor MN01.

[0068] The source electrode and drain electrode of the P-type MOStransistor MP01 are connected to a power supply VDD and internal nodeN1, respectively. The source electrodes of the N-type MOS transistorsMN01 and MN02 are connected to ground GND via a constant-current sourcewhose current value is capable of being varied by a constant-currentcontrol signal 113, and the drain currents of these transistors areconnected the internal node N1. The internal node N1 is furtherconnected to the input terminal of an inverter INV03 and to the drainelectrodes of N-type MOS transistors MN11-15. The gate electrodes of theN-type MOS transistors MN11-15 are each connected to a capacitancecontrol signal 112, and the source electrodes of these transistors areconnected to one ends of respective ones of capacitors CAP11-15. Theother ends of the capacitors CAP11-15 are connected commonly to groundGND.

[0069] The delay time of each delay circuit 102 is decided by the islogic value of the capacitance control signal 112. More specifically,the N-type MOS transistors MN11-15 are each renderedconductive/non-conductive by the logic value of the capacitance controlsignal 112, thereby selecting the number of capacitors CAP11-15connected to the internal node N1 and, hence, varying the delay time ofthe input signal IN1. In other words, the delay time of each delaycircuit 102 shown in FIG. 2 is set by the capacitance control signal(not shown in FIG. 2).

[0070] The construction of the delay circuit 102 is obtained bycombining into one the two inputs of a timing-difference dividingcircuit (see FIG. 4) 121 used in a frequency multiplier circuit or thelike, and the delay characteristic thereof is equivalent to that of atiming dividing circuit (interpolator) whose two inputs are timed to besimultaneous.

[0071] The operation of this embodiment will now be described.

[0072]FIG. 5 is a timing chart useful in describing the operation ofthis embodiment. The waveform indicated by the dashed line in each ofthe waveforms of outputs T21 to T28 of the respective delay circuits 102indicates the potential waveform at the internal node N1 of therespective delay circuit 102. The delay time of the delay circuit 102 isdecided by the preset capacitance value applied to the internal node N1.When the delay time arrives, the output changes to the high level viathe inverter INV03.

[0073] The output of the delay circuit 102 is maintained for the periodof time during which the high level of the clock signal 101 is appliedthereto.

[0074] The circuit at the boundary between outputs from delay circuitswhose outputs have changed over and outputs from delay circuits whoseoutputs have not changed over (i.e., whose outputs remain at the lowlevel) is identified by the encoders 104, which output the controlsignal 105 so as to select a suitable circuit constant in a delaycircuit, etc., of a subsequent stage. More specifically, as shown inFIG. 5, outputs P21-P26 of the latch circuits 103 all attain the highlevel and outputs P27-P28 of the latch circuits 103 remain at the lowlevel when the clock signal 101 undergoes a transition from the high tothe low level.

[0075] Each encoder circuit 104 receives the two outputs from twomutually adjacent latch circuits 103. If the values of these two outputsare different, the particular encoder specifies the boundary between theoutputs of the delay circuits 102 and outputs the encoded control signal105 (five bits in FIG. 2).

[0076] In the delay sensing circuit shown in FIG. 2, coarse adjustmentof timing is carried out. Fine adjustment of the delay circuit isperformed by variably setting the capacitance value based upon thecontrol signal 105.

[0077] In a case, as one example, where two successive clock signals ofa 4-phase clock enter the timing dividing circuit (interpolator:timing-difference dividing circuit) 121 shown in FIG. 4, there isselected a vicinity generally at the center of a range of capacitancesin which it is possible to output accurately a timing that is one-halfthe difference between the timings of the two inputs. This is an exampleof a delay-circuit capacitance value selected by the control signal 105.It should be noted that the timing dividing circuit (interpolator) 121shown in FIG. 4 has a construction basically the same as that of thedelay circuit shown in FIG. 3. The same input signal IN enters in FIG.3. In FIG. 4, on the other hand, signals obtained by inverting theinputs IN1 and IN2 by the inverters INV01 and INV02, respectively, arethe gate inputs of the N-type MOS transistors MN02 and MN01,respectively, and the NAND output of the inputs IN1 and IN2 is the gateinput to the P-type MOS transistor MP01.

[0078] By way of example, with regard to a multiphase (e.g., 4-phase)clock 203 produced by frequency-dividing the clock signal 101 by afrequency divider 202, as shown in FIG. 10 illustrating a clockfrequency multiplier circuit, a vicinity generally at the center of arange of capacitances in which it is possible to output a timing that isone-half the difference between the timings of two inputs is selected asa control signal 207 from a clock period sensing circuit 206. In FIG.10, the clock period sensing circuit 206 to which the clock signal 101is input is constituted by the clock period sensing circuit of thepresent invention shown in FIG. 2. A clock frequency multiplier circuit205 is constituted by timing-difference dividing units 204 a. Clocksignals obtained by multiplexing the outputs of the timing-differencedividing units 204 a by multiplexer circuits 204 b are combined by aclock combining circuit 208, whereby a frequency-multiplied clock 209 bis obtained. (For example, see Japanese Patent Kokai PublicationJP-A-11-4146.)

[0079] Thus, in this embodiment, there is provided a timing dividingcircuit (interpolator) which, by receiving the control signal 105indicative of the clock delay sensed by the circuit shown in FIG. 2, hasits capacitance value varied so that the timing thereof can be finelyadjusted.

[0080]FIG. 6 illustrates a circuit arrangement for extracting a timingwhich is one-half the difference between the input times of the twoinputs IN1, IN2 using the timing dividing circuit (interpolator) 121. Asshown in FIG. 6, the circuit comprises a timing dividing circuit(interpolator) TMD1 whose two inputs are connected to the first inputIN1 and whose output is A1; a timing dividing circuit (interpolator)TMD2 one of whose two inputs-is connected to the first input IN1, theother of whose two inputs is connected to the second input IN2 and whoseoutput is A2; and a timing dividing circuit (interpolator) TMD3 both ofwhose two inputs are connected to the second input IN2 and whose outputis A3.

[0081] As shown in FIG. 7, the difference between the timings of theoutputs A1 and A3 is absolutely equal to the difference between theinput times of the inputs IN1, IN2. The difference between the inputtimes of A1 and A2 becomes exactly one-half of the difference betweenthe input times of IN1 and IN2 if the output A2 is delivered from theend of the period during which only IN1 is high to the end of the periodduring which both IN1 and IN2 are high. This characteristic is decidedby the capacitance value within the timing dividing circuit(interpolator) TMD2 (see CAP11-CAP14 in FIG. 4).

[0082]FIG. 8 is a diagram showing the relationship between thecapacitance of the timing dividing circuit (interpolator) and delayratio [=A2/(A3-A1)]. As illustrated in FIG. 8, capacitance values foroutputting a delay time which is exactly half (i.e., delay ratio=50%)range from a capacitance value Cmin, which is exactly that at which anoutput is obtained during the input time difference of IN1 and IN2 onlyin a period during which IN1 is at the high level, to a capacitancevalue that is three times this capacitance value (i.e., Cmax=3×Cmin).

[0083] In this embodiment, therefore, in order to sense the delay 10time in each delay circuit 102, as shown in FIG. 9, a value (capacitanceC=tCK×2i/Vt, where Vt represents amplitude voltage, i theconstant-current value and tCK the clock period) exactly in the middleof the above-mentioned range of capacitances is taken by selecting acapacitance value at which the output is inverted by two simultaneousinputs (IN1 in FIG. 3). In FIG. 9, the clock cycle is plotted along thehorizontal axis and delay time along the vertical axis. As will beappreciated from Fig. 9, the capacitance value is set in such a mannerthat the operating regions of neighboring delay circuits overlap and thecenters of operation thereof differ from one another.

[0084] Further, by making the delay times of the delay circuits 102approximately 1.5 times X1, X1.5, X2, X4, X6, X8, X12 and X16, thecharacteristics for outputting a time which is one-half the differencebetween the two inputs in the timing dividing circuit (interpolator)will overlap.

[0085] Thus, in accordance with the present invention as describedabove, it is possible to broaden the operating range of phase adjustmentand frequency multiplier circuits, etc., by adopting an arrangement inwhich a coarse period adjustment is performed in advance.

[0086] More specifically, in accordance with the present invention,delay sensing circuits having slightly overlapping operating ranges arearranged in parallel, a clock signal is passed through the delay sensingcircuits and clock period is sensed coarsely in short periods based upona delay component between delay sensing circuits traversed by the clocksignal and delay sensing circuits not traversed by the clock signal.

[0087] As many apparently widely different embodiments of the presentinvention can be made without departing from the spirit and scopethereof, it is to be understood that the invention is not limited to thespecific embodiments thereof except as defined in the appended claims.

[0088] It should be noted that other objects, features and aspects ofthe present invention will become apparent in the entire disclosure andthat modifications may be done without departing the gist and scope ofthe present invention as disclosed herein and claimed as appendedherewith.

[0089] Also it should be noted that any combination of the disclosedand/or claimed elements, matters and/or items may fall under themodifications aforementioned.

What is claimed is:
 1. A clock period sensing circuit comprising: aplurality of parallel connected delay sensing circuits having slightlyoverlapping operating ranges and different centers of operation, whereina clock signal is passed through said plurality of delay sensingcircuits, and a period of the clock is sensed using a signal whichidentifies delay sensing circuits through which the clock signal haspassed and delay sensing circuits through which the clock signal has notpassed.
 2. A clock period sensing circuit comprising: a plurality ofdelay circuits to which a clock signal is applied as a common input andwhich are arranged in parallel and have delay times that differ from oneanother; a plurality of latch circuits to which outputs of respectiveones of said delay circuits are input for latching the clock signal as alatch timing signal; and a plurality of encoder circuits to which theoutputs of said latch circuits are input for encoding informationrepresenting a boundary between delay circuits traversed by the clocksignal and delay circuits not traversed by the clock signal, andoutputting the encoded information as a control signal.
 3. The circuitaccording to claim 2, wherein said plurality of delay circuits haveoperating ranges that overlap each other slightly and centers ofoperation that differ from one another.
 4. The circuit according toclaim 2, wherein each of said delay circuits has: a P-type transistorwhich is connected between a power supply and an internal node and towhich a signal obtained by inverting an input signal is applied as agate input; and an N-type transistor, which is driven by aconstant-current source, connected between said internal node and groundand to which the signal obtained by inverting the input signal isapplied as a gate input; a plurality of serially connected switches andcapacitors being connected in parallel between said internal node andground, and delay time being decided by deciding a capacitance appliedto said internal node by a capacitance control signal connected to acontrol terminal of each switch; said delay circuit having an inverterfor inverting and outputting a potential present at said internal node.5. A timing dividing circuit (interpolator) comprising: first, secondand third timing dividing circuits (interpolators) connected in paralleland each having a P-type transistor which is connected between a powersupply and an internal node and to which a signal obtained by takingNAND between first and second input signals is applied as a gate input,and first and second N-type transistors, which are driven by aconstant-current source, connected between said internal node and groundand to which signals obtained by inverting the first and second inputsignals are applied as gate inputs; a plurality of serially connectedswitches and capacitors being connected in parallel between saidinternal node and ground, and delay time being decided by deciding acapacitance applied to said internal node by a capacitance controlsignal connected to a control terminal of each switch; each timingdividing circuit (interpolator) having an inverter for inverting andoutputting a potential present at said internal node; wherein a firstclock of two clocks having different phases is supplied commonly as thefirst and second input signals to said first timing dividing circuit(interpolator); first and second clocks constituting the two clockshaving the different phases are supplied as the first and second inputsignals to said second timing dividing circuit (interpolator); and asecond clock of the two clocks having the different phases is suppliedcommonly as the first and second input signals to said third timingdividing circuit (interpolator); the capacitance of said timing dividingcircuit (interpolator) being selected by the control signal from theclock period sensing circuit according to claim
 1. 6. A timing dividingcircuit (interpolator) comprising: first, second and third timingdividing circuits (interpolators) connected in parallel and each havinga P-type transistor which is connected between a power supply and aninternal node and to which a signal obtained by taking NAND betweenfirst and second input signals is applied as a gate input, and first andsecond N-type transistors, which are driven by a constant-currentsource, connected between said internal node and ground and to whichsignals obtained by inverting the first and second input signals areapplied as gate inputs; a plurality of serially connected switches andcapacitors being connected in parallel between said internal node andground, and delay time being decided by deciding a capacitance appliedto said internal node by a capacitance control signal connected to acontrol terminal of each switch; each timing dividing circuit(interpolator) having an inverter for inverting and outputting apotential present at said internal node; wherein a first clock of twoclocks having different phases is supplied commonly as the first andsecond input signals to said first timing dividing circuit(interpolator); first and second clocks constituting the two clockshaving the different phases are supplied as the first and second inputsignals to said second timing dividing circuit (interpolator); and asecond clock of the two clocks having the different phases is suppliedcommonly as the first and second input signals to said third timingdividing circuit (interpolator); the capacitance of said timing dividingcircuit (interpolator) being selected by the control signal from theclock period sensing circuit according to claim
 2. 7. A timing dividingcircuit (interpolator) comprising: first, second and third timingdividing circuits (interpolators) connected in parallel and each havinga P-type transistor which is connected between a power supply and aninternal node and to which a signal obtained by taking NAND betweenfirst and second input signal is is applied as a gate input, and firstand second N-type transistors, which are driven by a constant-currentsource, connected between said internal node and ground and to whichsignals obtained by inverting the first and second input signals areapplied as gate inputs; a plurality of serially connected switches andcapacitors being connected in parallel between said internal node andground, and delay time being decided by deciding a capacitance appliedto said internal node by a capacitance control signal connected to acontrol terminal of each switch; each timing dividing circuit(interpolator) having an inverter for inverting and outputting apotential present at said internal node; wherein a first clock of twoclocks having different phases is supplied commonly as the first andsecond input signals to said first timing dividing circuit(interpolator); first and second clocks constituting the two clockshaving the different phases are supplied as the first and second inputsignals to said second timing dividing circuit (interpolator); and asecond clock of the two clocks having the different phases is suppliedcommonly as the first and second input signals to said third timingdividing circuit (interpolator); the capacitance of said timing dividingcircuit (interpolator) being selected by the control signal from theclock period sensing circuit according to claim
 3. 8. A timing dividingcircuit (interpolator) comprising: first, second and third timingdividing circuits (interpolators) connected in parallel and each havinga P-type transistor which is connected between a power supply and aninternal node and to which a signal obtained by taking NAND betweenfirst and second input signals is applied as a gate input, and first andsecond N-type transistors, which are driven by a constant-currentsource, connected between said internal node and ground and to whichsignals obtained by inverting the first and second input signals areapplied as gate inputs; a plurality of serially connected switches andcapacitors being connected in parallel between said internal node andground, and delay time being decided by deciding a capacitance appliedto said internal node by a capacitance control signal connected to acontrol terminal of each switch; each timing dividing circuit(interpolator) having an inverter for inverting and outputting apotential present at said internal node; wherein a first clock of twoclocks having different phases is supplied commonly as the first andsecond input signals to said first timing dividing circuit(interpolator); first and second clocks constituting the two clockshaving the different phases are supplied as the first and second inputsignals to said second timing dividing circuit (interpolator); and asecond clock of the two clocks having the different phases is suppliedcommonly as the first and second input signals to said third timingdividing circuit (interpolator); the capacitance of said timing dividingcircuit (interpolator) being selected by the control signal from theclock period sensing circuit according to claim
 4. 9. The timingdividing circuit (interpolator) according to claim 5, wherein thecapacitance is set in such a manner that ranges over which the timingdividing circuit (interpolator) outputs a timing which is one-half thedifference between the timings of the first and second clock inputs overlap each other along a time axis.
 10. The timing dividing circuit(interpolator) according to claim 6, wherein the capacitance is set insuch a manner that ranges over which the timing dividing circuit(interpolator) outputs a timing which is one-half the difference betweenthe timings of the first and second clock inputs overlap each otheralong a time axis.
 11. A clock frequency multiplier circuit foroutputting a frequency-multiplied clock, comprising: a frequencydividing circuit for frequency-dividing a clock signal, generating andoutputting a multiphase clock; a clock period sensing circuit to whichthe clock signal is input; a plurality of timing dividing circuits(interpolators) for outputting timing signals obtaining by dividingdifferences between input timings of the multiphase clock; andmultiplexer circuits for multiplexing outputs of said plurality oftiming dividing circuits (interpolators); wherein said clock periodsensing circuit comprises the clock period sensing circuit described inclaim
 1. 12. A clock frequency multiplier circuit for outputting afrequency-multiplied clock, comprising: a frequency dividing circuit forfrequency-dividing a clock signal, generating and outputting amultiphase clock; a clock period sensing circuit to which the clocksignal is input; a plurality of timing dividing circuits (interpolators)for outputting timing signals obtaining by dividing differences betweeninput timings of the multiphase clock; and multiplexer circuits formultiplexing outputs of said plurality of timing dividing circuits(interpolators); wherein said clock period sensing circuit comprises theclock period sensing circuit described in claim
 2. 13. A clock frequencymultiplier circuit for outputting a frequency-multiplied clock,comprising: a frequency dividing circuit for frequency-dividing a clocksignal, generating and outputting a multiphase clock; a clock periodsensing circuit to which the clock signal is input; a plurality oftiming dividing circuits (interpolators) for outputting timing signalsobtaining by dividing differences between input timings of themultiphase clock; and multiplexer circuits for multiplexing outputs ofsaid plurality of timing dividing circuits (interpolators); wherein saidclock period sensing circuit comprises the clock period sensing circuitdescribed in claim
 3. 14. A clock frequency multiplier circuit foroutputting a frequency-multiplied clock, comprising: a frequencydividing circuit for frequency-dividing a clock signal, generating andoutputting a multiphase clock; a clock period sensing circuit to whichthe clock signal is input; a plurality of timing dividing circuits(interpolators) for outputting timing signals obtaining by dividingdifferences between input timings of the multiphase clock; andmultiplexer circuits for multiplexing outputs of said plurality oftiming dividing circuits (interpolators); wherein said clock periodsensing circuit comprises the clock period sensing circuit described inclaim
 4. 15. The clock frequency multiplier circuit according to claim11, wherein each of said timing dividing circuits (interpolators) has: aP-type transistor which is connected between a power supply and aninternal node and to which a signal obtained by taking NAND betweenfirst and second input signals is applied as a gate input; and first andsecond N-type transistors, which are driven by a constant-currentsource, connected between said internal node and ground and to whichsignals obtained by inverting the first and second input signals areapplied as gate inputs; a plurality of serially connected switches andcapacitors being connected in parallel between said internal node andground, and amount of delay being decided by deciding a capacitanceapplied to said internal node by a capacitance control signal connectedto a control terminal of each switch; each timing dividing circuit(interpolator) having an inverter for inverting and outputting apotential present at said internal node; the capacitance being decidedby a control signal from said clock period sensing circuit.
 16. Theclock frequency multiplier circuit according to claim 12, wherein eachof said timing dividing circuits (interpolators) has: a P-typetransistor which is connected between a power supply and an internalnode and to which a signal obtained by taking NAND between first andsecond input signals is applied as a gate input; and first and secondN-type transistors, which are driven by a constant-current source,connected between said internal node and ground and to which signalsobtained by inverting the first and second input signals are applied asgate inputs; a plurality of serially connected switches and capacitorsbeing connected in parallel between said internal node and ground, andamount of delay being decided by deciding a capacitance applied to saidinternal node by a capacitance control signal connected to a controlterminal of each switch; each timing dividing circuit (interpolator)having an inverter for inverting and outputting a potential present atsaid internal node; the capacitance being decided by a control signalfrom said clock period sensing circuit.
 17. The circuit according toclaim 2, wherein each of said delay circuits has: a first-typetransistor which is connected between a power supply and an internalnode and to which a signal indicative of an input signal is applied as agate input; and a second-type transistor, which is driven by aconstant-current source, connected between said internal node and groundand to which the signal indicative of the input signal is applied as agate input; a plurality of serially connected switches and capacitorsbeing connected in parallel between said internal node and ground, anddelay time being decided by deciding a capacitance applied to saidinternal node by a capacitance control signal connected to a controlterminal of each switch; said delay circuit outputting an output signalindicative of a potential present at said internal node.
 18. A timingdividing circuit (interpolator) comprising: first, second and thirdtiming dividing circuits (interpolators) connected in parallel and eachhaving a first-type transistor which is connected between a power supplyand an internal node and to which a signal obtained by taking logicbetween first and second input signals is applied as a gate input, andfirst and second-type transistors, which are driven by aconstant-current source, connected between said internal node and groundand to which a signal obtained by inverting said signal obtained fromthe first and second input signals is applied as gate inputs; aplurality of serially connected switches and capacitors being connectedin parallel between said internal node and ground, and delay time beingdecided by deciding a capacitance applied to said internal node by acapacitance control signal connected to a control terminal of eachswitch; each timing dividing circuit (interpolator) outputting an outputsignal indicative of a potential present at said internal node; whereina first clock of two clocks having different phases is supplied commonlyas the first and second input signals to said first timing dividingcircuit (interpolator); first and second clocks constituting the twoclocks having the different phases are supplied as the first and secondinput signals to said second timing dividing circuit (interpolator) anda second clock of the two clocks having the different phases is suppliedcommonly as the first and second input signals to said third timingdividing circuit (interpolator); the capacitance of said timing dividingcircuit (interpolator) being selected by the control signal from theclock period sensing circuit according to claim 1.